EVALUATION OF THE EFFECT OF ELECTRON-ENER GY SPECTRUM ON THE PROCESS OF THEIR HEATING IN N-CHANNEL OF SILICON SUBMICRON MOS-FIELD TRANSISTOR

Citation
Vm. Borzdov et al., EVALUATION OF THE EFFECT OF ELECTRON-ENER GY SPECTRUM ON THE PROCESS OF THEIR HEATING IN N-CHANNEL OF SILICON SUBMICRON MOS-FIELD TRANSISTOR, Pis'ma v Zurnal tehniceskoj fiziki, 19(16), 1993, pp. 33-37
Citations number
9
Categorie Soggetti
Physics, Applied
ISSN journal
03200116
Volume
19
Issue
16
Year of publication
1993
Pages
33 - 37
Database
ISI
SICI code
0320-0116(1993)19:16<33:EOTEOE>2.0.ZU;2-Q