A DIFFRACTION STUDY OF AMORPHOUS SI0.40C0.24N0.36

Authors
UHLIG H FRIESS M DURR J BELLISSENT R LAMPARTER HP ALDINGER F STEEB S
Citation
H. Uhlig et al., A DIFFRACTION STUDY OF AMORPHOUS SI0.40C0.24N0.36, Zeitschrift fur Naturforschung. A, A journal of physical sciences, 51(12), 1996, pp. 1179-1184
Citations number
12
Categorie Soggetti
Chemistry Physical",Physics
Journal title
Zeitschrift fur Naturforschung. A, A journal of physical sciences → ACNP
ISSN journal
09320784
Volume
51
Issue
12
Year of publication
1996
Pages
1179 - 1184
Database
ISI
SICI code
0932-0784(1996)51:12<1179:ADSOAS>2.0.ZU;2-7
Abstract
In the present work, amorphous Si0.4C0.24N0.36 samples were investigat ed. X-ray and neutron diffraction experiments were performed, in order to evaluate the structure factors by the method of contrast variation . The structure can be described as crosslinked Si-N-C matrices. Withi n these matrices SiN4 tetrahedra are predominant. Direct Si-Si contact does not occur. We report on the short range order and the nature of chemical bonding.