MICROSCOPY AND MICROANALYSIS OF INTERFACES ON A SUBNANOMETRIC SCALE WITH THE ATOM-PROBE

Citation
D. Blavette et al., MICROSCOPY AND MICROANALYSIS OF INTERFACES ON A SUBNANOMETRIC SCALE WITH THE ATOM-PROBE, Annales de chimie, 18(5-6), 1993, pp. 303-310
Citations number
14
Categorie Soggetti
Chemistry,"Material Science
Journal title
ISSN journal
01519107
Volume
18
Issue
5-6
Year of publication
1993
Pages
303 - 310
Database
ISI
SICI code
0151-9107(1993)18:5-6<303:MAMOIO>2.0.ZU;2-8
Abstract
Atom-probe techniques were used to study grain boundary segregation an d interphase interfaces (gamma/gamma') in nickel base superalloys. Exp eriments conducted with a conventional atom-probe reveal a strong enri chment of boron and molybdenum in Astroloy superalloys. The influence of heat treatment on the geometry and local chemistry of boundaries is discussed. Non-equilibrium concentration gradients observed in the cl ose vicinity of gamma/gamma' interfaces are also reported. The 3D reco nstruction of a small volume of superalloy on a near atomic scale illu strates the performance of the Tomographic Atom-Probe recently develop ed, in atomic imaging of interfaces.