HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INTERFACES IN NANO-MATERIALS

Citation
Y. Ishida et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INTERFACES IN NANO-MATERIALS, Annales de chimie, 18(5-6), 1993, pp. 415-421
Citations number
4
Categorie Soggetti
Chemistry,"Material Science
Journal title
ISSN journal
01519107
Volume
18
Issue
5-6
Year of publication
1993
Pages
415 - 421
Database
ISI
SICI code
0151-9107(1993)18:5-6<415:HEOIIN>2.0.ZU;2-E
Abstract
Metallic, oxide and metal-oxide composite nano-materials were produced and their properties were investigated in connection with structural features mainly by high resolution electron microscopy. The observed m etallic grain boundaries were not disordered in atomic arrangement. Sh ort period CSL boundaries frequently appeared. Long period boundaries were rarely observed. A void was frequently observed at the grain boun dary triple point. Shape of the void was round. Structural relaxation at room temperature was detected by positron life time measurement. It is suggested that the low density of the metallic nano-material is at tributed not to the low density grain boundary region but to existing voids. High chemical activity of metal ceramic interface of Bi2Sr2CaCu 3Ox-Ag composite nano-material was expected to give excellent measured properties such as high Jc and high plasticity.