The critical current I(c)(B. T. theta) of Ag-sheathed Bi(2223) tape wa
s measured at 4.2 and 77 K magnetic field up to 6 T as a function of t
he field direction. The maximum I(c) is observed when the flux line ar
e along the CuO2 planes. This effect is due to an intrinsic pinning be
tween CuO2 layers. When H > 0.5 T at 4.2K. I(c) decreases very slowly
with the magnetic field. The results are consistent with our early-pro
posed scaling laws for flux pinning in Ag-sheathed tape.