High-resolution electron microscopy of wurtzite type CdSe epilayers gr
own on (111) GaAs revealed that interfacial misfit dislocations are pe
rfect 60-degrees dislocations with Burgers vectors parallel to the int
erface. Glide is therefore limited to the (0001) interface plane and t
he extension of dislocations into the epilayer is suppressed. Single-b
eam bright field imaging shows that the 7% mismatched epilayer is free
of a dislocation network in its volume.