J. Bohrer et al., 2-DIMENSIONAL ELECTRON AND HOLE STATES AT THE STAGGERED BAND LINE-UP INTERFACE OF INALAS INP/, Applied physics letters, 63(21), 1993, pp. 2955-2957
Crystallographic and electronic properties of the staggered band line-
up InAlAs/InP interface grown by metal-organic chemical-vapor depositi
on are studied using double crystal x-ray diffraction, Shubnikov-de-Ha
as (SdH), capacitance-voltage, and calorimetric absorption experiments
. Observation of a large number of Pendellosung oscillations in the x-
ray rocking curves, which can be perfectly modeled using dynamical dif
fraction theory, demonstrate the high crystallographic quality of the
interfaces. A two-dimensional electron gas (2DEG) with n(s) approximat
ely 6 x 10(11) cm-2 is formed at the InP side of the interface by carr
ier transfer from the unintentionally doped InAlAs. The electronic str
ucture of the interface is derived from self-consistent band structure
calculation including many particle corrections and good agreements a
re found with experimentally observed subband transitions up to n=4.