The coefficient of thermal expansion (CTE) for thin polymer films is a
property of considerable practical importance. In contrast to the abu
ndance of CTE data in the in-plane or film direction, data in the thic
kness or z-direction is rarely available, in part due to the high sens
itivity required for measurement of the small thickness changes involv
ed. In this paper, we will describe both a capacitance change and a Fa
bry-Perot laser interferometric method for measuring z-direction CTE's
. Results are presented for a variety of commercially available polyim
ide films of thickness 50 to 130 mum. Upilex and Kapton were found to
have z-direction CTE's of about 55 and 81 ppm/degrees-C, respectively.
These CTE's for the thickness direction are many times higher than th
e corresponding values in the in-plane direction. This anisotropy is a
ttributed to the preferential in-plane molecular orientation of the po
lymer chains.