SURFACE-INDUCED ION NEUTRALIZATION WITH HIGH-ENERGY DEPOSITION

Citation
Ra. Chorush et al., SURFACE-INDUCED ION NEUTRALIZATION WITH HIGH-ENERGY DEPOSITION, Organic mass spectrometry, 28(10), 1993, pp. 1016-1020
Citations number
30
Categorie Soggetti
Chemistry Inorganic & Nuclear",Spectroscopy
Journal title
ISSN journal
0030493X
Volume
28
Issue
10
Year of publication
1993
Pages
1016 - 1020
Database
ISI
SICI code
0030-493X(1993)28:10<1016:SINWHD>2.0.ZU;2-0
Abstract
Ion-to-neutral conversion at surfaces is found to be complementary to what with gas-phase targets for neutralization-reionization mass spect rometry and to yield high-energy neutral species. With an Ag surface d eposited on an in-line Si substrate, neutralization reionization effic iencies of 0.01% are achieved using 9.8 keV CH4+, with the neutral CH4 receiving a median internal energy of 14 eV; with a conventional targ et of K vapor, the efficiency is 0.4% with a neutral energy of 8.2 eV expected from their ionization energy difference. The energy depositio n can be increased by increasing the potential that deflects ions into the surface; in this way approximately 15% of CH4 neutral species can be given > 20 eV of internal energy. Product abundances from CH4 diss ociation provide a useful estimate of the distribution of energy value s deposited in neutralization.