PHOTOLITHOGRAPHY OF AMORPHOUS FILMS OF (ETA(5)-C5H5)2TI(N3)2 ON SILICON(111) RESULTING IN TIO2 - THE MECHANISM OF THE PHOTODEPOSITION REACTION

Citation
Bj. Palmer et al., PHOTOLITHOGRAPHY OF AMORPHOUS FILMS OF (ETA(5)-C5H5)2TI(N3)2 ON SILICON(111) RESULTING IN TIO2 - THE MECHANISM OF THE PHOTODEPOSITION REACTION, Journal of Materials Science, 28(22), 1993, pp. 6013-6020
Citations number
36
Categorie Soggetti
Material Science
ISSN journal
00222461
Volume
28
Issue
22
Year of publication
1993
Pages
6013 - 6020
Database
ISI
SICI code
0022-2461(1993)28:22<6013:POAFO(>2.0.ZU;2-K
Abstract
Photolithography to produce TiO2 patterns from amorphous films of (eta 5-C5H5)2Ti(N3)2 has been demonstrated. The efficiency of the reaction has been measured yielding a quantum yield of 0.025. The mechanism of the photoreactions of (eta5-C5H5)2Ti(N3)2 has been studied using Fouri er transform-infrared spectroscopy in both a low-temperature 1,2-epoxy ethylbenzene glass and as surface films. In each case the primary phot ochemical process was found to be loss of a single azido group. The re sult of subsequent photolysis was found to be dependent upon medium an d temperature. In the low-temperature glass no further photochemistry was observed. The exhaustive photolysis of films at 20 K, or room temp erature, under a vacuum or in air led to loss of all ligands and the f ormation of TiO2.