With the development of complex multimode computerized microscope syst
ems, it is possible and necessary to obtain images of the same area of
the microscopical preparation by several methods of microscopy, such
as differential interference contrast, reflection interference microsc
opy, several wavelengths of fluorescence microscopy, laser scanning an
d confocal modes. Thus, varied information may be obtained about a sin
gle field, in the form of a set of images, taken at different ports of
the microscope, using different digitizing cameras, each appropriate
to certain tasks. For comparative purposes, the images should be super
imposable, pixel by pixel, but in general they are not - they differ i
n image shape and size, magnification, distortion, centration and orie
ntation. This paper shows how the problem may be approached, using an
extension of the remapping procedures described in a previous paper, i
n which images of a separate grid reference slide are used to detect,
quantify and correct the image errors. Affine remapping, without the u
se of grid images, is also described.