Nb/Al/AlOx/Nb junctions have been shown to be effective x-ray detector
s that are robust to thermal cycling. We compare results from two junc
tions, one with a fine-grained base-layer electrode and counterelectro
de and the other with an epitaxial base-layer electrode and a fine-gra
ined counterelectrode. For a 6 keV x-ray, at 0.4 K, the epitaxial samp
le had a FWHM resolution of 157 eV and the fine-grained junction had a
FWHM resolution of 300 eV. The differences between the junctions will
be discussed.