SYNCHROTRON-RADIATION-INDUCED X-RAY-MICROANALYSIS

The qualities and limitations of synchrotron radiation-induced x-ray m icrofluorescence (SRXRF) spectrometry are discussed in comparison with those of more conventional microchemical techniques such as secondary ion microscopy and electron probe microanalysis. Examples of the anal ysis of particulates and the two-dimensional mapping of elemental spec ies are given. Two new developments in connection with SRXRF are discu ssed: the use of microscopic x-ray absorption spectrometry and the pre dicted performance of SRXRF spectrometers installed with third-generat ion synchrotron sources.