SYNCHROTRON-RADIATION-INDUCED X-RAY-MICROANALYSIS

Citation
K. Janssens et al., SYNCHROTRON-RADIATION-INDUCED X-RAY-MICROANALYSIS, Analytica chimica acta, 283(1), 1993, pp. 98-110
Citations number
34
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032670
Volume
283
Issue
1
Year of publication
1993
Pages
98 - 110
Database
ISI
SICI code
0003-2670(1993)283:1<98:SX>2.0.ZU;2-7
Abstract
The qualities and limitations of synchrotron radiation-induced x-ray m icrofluorescence (SRXRF) spectrometry are discussed in comparison with those of more conventional microchemical techniques such as secondary ion microscopy and electron probe microanalysis. Examples of the anal ysis of particulates and the two-dimensional mapping of elemental spec ies are given. Two new developments in connection with SRXRF are discu ssed: the use of microscopic x-ray absorption spectrometry and the pre dicted performance of SRXRF spectrometers installed with third-generat ion synchrotron sources.