The qualities and limitations of synchrotron radiation-induced x-ray m
icrofluorescence (SRXRF) spectrometry are discussed in comparison with
those of more conventional microchemical techniques such as secondary
ion microscopy and electron probe microanalysis. Examples of the anal
ysis of particulates and the two-dimensional mapping of elemental spec
ies are given. Two new developments in connection with SRXRF are discu
ssed: the use of microscopic x-ray absorption spectrometry and the pre
dicted performance of SRXRF spectrometers installed with third-generat
ion synchrotron sources.