Hy. Chin et K. Danai, IMPROVED FLAGGING FOR PATTERN CLASSIFYING DIAGNOSTIC SYSTEMS, IEEE transactions on systems, man, and cybernetics, 23(4), 1993, pp. 1101-1107
Citations number
13
Categorie Soggetti
Controlo Theory & Cybernetics","Computer Applications & Cybernetics
Fault detection and isolation (diagnosis) is based on residual generat
ion and residual analysis. The model-based approach flags the residual
s through thresholding, to isolate the effect of faults from noise, an
d performs diagnosis by mapping the residuals to a residual space with
prespecified fault signatures. The main problem with this approach is
that thresholds are not always able to differentiate between the effe
ct of faults and noise, so this approach suffers from false alarms, un
detected faults, and misdiagnosis. As an alternative to prespecified f
ault signatures and to cope with their variability, the use of pattern
classification techniques has been proposed. However, since the fault
signatures established by these classifiers are formed irrespective o
f diagnosability, this approach is also prone to misdiagnosis. In this
paper we demonstrate the application of a flagging unit that enhances
the quality of fault signatures. This Unit, which relies on a trainin
g set to tune its parameters, is shown to improve detection, reduce th
e number of false alarms and enhance diagnostics.