In2O3-SnO2 films were produced by thermal decomposition of a deposit w
hich was dip coated on borosilicate glass substrates from an acetylace
tone solution of indium and tin acetoacetonate. Thermal analysis showe
d complete pyrolysis of the organics by 400-degrees-C. The thermal dec
omposition reaction generated acetylacetone gas and was found to be fi
rst order with an activation energy of 13.6 Kcal/mole. Differences in
thermal decomposition between the film and bulk materials were noted.
As measured by differential scanning calorimetry using a 40-degrees-C/
min temperature ramp, the glass transition temperature of the deposite
d oxide film was found to be approximately 462-degrees-C, and the film
crystallization temperature was found to be approximately 518-degrees
-C. For film fabrication, thermal decomposition of the films was perfo
rmed at 500-degrees-C in air for 1 h followed by reduction for various
times at 500-degrees-C in a reducing atmosphere. Crystalline films re
sulted for these conditions. A resistivity of approximately 1.01 x 10(
-3) OMEGA . cm, at 8 wt.% tin oxide with a transparency of approximate
ly 95% at 400 nm, has been achieved for a 273 nm thick film.