LEED ANALYSIS OF ULTRA-THIN COBALT LAYERS GROWN ON CR(100)

Authors
SCHEURER F OHRESSER P CARRIERE B DEVILLE JP BAUDOINGSAVOIS R GAUTHIER Y
Citation
F. Scheurer et al., LEED ANALYSIS OF ULTRA-THIN COBALT LAYERS GROWN ON CR(100), Surface science, 298(1), 1993, pp. 107-113
Citations number
27
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
298
Issue
1
Year of publication
1993
Pages
107 - 113
Database
ISI
SICI code
0039-6028(1993)298:1<107:LAOUCL>2.0.ZU;2-M
Abstract
Cobalt overlayers grown at room temperature on a chromium (100) surfac e have been studied with low energy electron diffraction (LEED) up to a thickness of four atomic layers. A quantitative analysis via dynamic al LEED calculations is given for zero and two cobalt layers grown on Cr(100). A metastable bcc phase of cobalt is evidenced. The influence of nitrogen contamination of the films is discussed.