Hydrogenated amorphous Silicon (a-Si:H) films have been thermally anne
aled at temperatures in the range 220 degrees C to 270 degrees C for 4
8 hours, either under intense visible light illumination (15 watts/cm(
2)) or in the dark. After each annealing, the hydrogen concentration p
rofile was measured with RBS-ERDA ion beam analysis methods. Substanti
al enhancement of the hydrogen diffusion constant D was observed in th
e illuminated samples. To our knowledge, this is the first observation
of this effect directly in a-Si:H films. Our results are in agreement
with others obtained with a-Si:H/a-Si:D/a-Si:H sandwiches by SIMS (Se
condary Ion Mass Spectroscopy).