LOW-TEMPERATURE FAR-INFRARED ELLIPSOMETRY OF CONVERGENT-BEAM

Authors
SUSHKOV AB TISHCHENKO EA
Citation
Ab. Sushkov et Ea. Tishchenko, LOW-TEMPERATURE FAR-INFRARED ELLIPSOMETRY OF CONVERGENT-BEAM, International journal of infrared and millimeter waves, 14(12), 1993, pp. 2555-2568
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied",Optics
Journal title
International journal of infrared and millimeter waves → ACNP
ISSN journal
01959271
Volume
14
Issue
12
Year of publication
1993
Pages
2555 - 2568
Database
ISI
SICI code
0195-9271(1993)14:12<2555:LFEOC>2.0.ZU;2-O
Abstract
Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, includin g a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength, measurement technique and a compensating orientation of cryostat windows. Experimental results ar e presented: for a gold film and UBe13 Single crystal at room temperat ure (lambda = 119 mum), temperature dependencies of the complex dielec tric function of SrTiO3 (lambda = 119, 84 and 28 mum) and of YBa2Cu3O7 -delta Ceramic (lambda = 119 mum).