SYNCHROTRON X-RAY TOPOGRAPHY STUDY OF ER-DOPED LAP5O14 CRYSTAL

Citation
Zw. Hu et al., SYNCHROTRON X-RAY TOPOGRAPHY STUDY OF ER-DOPED LAP5O14 CRYSTAL, Journal of applied physics, 74(12), 1993, pp. 7124-7128
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
74
Issue
12
Year of publication
1993
Pages
7124 - 7128
Database
ISI
SICI code
0021-8979(1993)74:12<7124:SXTSOE>2.0.ZU;2-N
Abstract
An Er-doped LaP5O14 ferroelastic crystal has been studied by synchrotr on radiation white beam x-ray topography. A set of normal ferroelastic domains is revealed in topographs by the intense contrast at the doma in walls and the temperature dependence of the wall contrast is shown to be in good agreement with that expected from the structural conside ration. In addition to growth bands and growth sector boundaries, a ty pe of abnormal boundary is observed, and the contrast varies with the occurrence of phase transitions. A detailed discussion on experimental results is given in terms of structural and symmetry analyses.