The resistance of NiAuGe/Au ohmic contacts on n-type GaAs, grown by mo
lecular beam epitaxy, on (111)A GaAs substrates which are misoriented
by 5-degrees toward [100] has been studied. The ohmic contacts were fo
rmed by simultaneously evaporating Ni and a eutectic alloy of AuGe and
then evaporating a layer of Au. The contacts were alloyed at 450-degr
ees-C. Contact resistances (R(c)) from 0.035 OMEGA . mm to 0.056 OMEGA
-mm are observed.