NEW METHOD FOR STUDYING SURFACE AND INTERFACE STRUCTURES USING KOSSELLINES

The angular dependence of Kossel lines from Ge single crystals excited by monochromatized synchrotron radiation was measured precisely in th e double-crystal arrangement where the first crystal acts as a sample and the second as an analyzer. The Kossel line profiles showed surface sensitivifies when the excitation beam was incident on the crystal su rface at a small angle or when its wavelength was slightly shorter tha n the absorption edge of Ge. The profiles were compared with the calcu lations based on the dynamical theory using the reciprocity theorem. T he relationship with the X-ray standing wave method was clarified.