A review of the application of semiconductor layers grown at low subst
rate temperatures to ultrafast optoelectronics is presented. The films
, grown by molecular beam epitaxy primarily around 200 degrees C and s
ubsequently annealed, are demonstrated to have high resistivity, high
mobility, an ultrashort carrier lifetime, and a high dielectric breakd
own. This combination of properties makes the low-temperature-grown ma
terials perfectly suited for use in high-speed optoelectronic devices.
A number of issues which influence the application of these materials
, such as growth temperature, use of an annealing process, layer thick
ness, and optical wavelength, are considered. Examples of low-temperat
ure-grown semiconductor optoelectronic devices, including ultra-high-b
andwidth photoconductive detectors, high-sensitivity, high-bandwidth M
SM photodetectors, and optical temporal analyzers are demonstrated. Wh
ile the discussion concentrates on low-temperatures-grown GaAs, the la
ttice-mismatched ternary compound InxGal-xAs/GaAs is also considered i
n the context of detection of the longer wavelengths used in optical c
ommunications.