A COMPLETE CHARACTERIZATION OF X-RAY-POLARIZATION STATE BY COMBINATION OF SINGLE AND MULTIPLE BRAGG-REFLECTIONS

We present a simple method for complete determination of the x-ray pol arization state, using just one Bragg reflection from a single-crystal analyzer. For the linear polarization components P1 and P2, we show t hat the usual method of using a 90-degrees Bragg reflection can be ext ended to using any Bragg reflection with 20 not-equal 90-degrees. For circular component P3, we use the intensity modulation profile in an a zimuthal rotation caused by the phase-sensitive interference around a multiple-beam Bragg reflection. The combination of the two measurement s allows a straightforward complete determination of x-ray polarizatio n, including an unpolarized component, in a broad applicable energy ra nge.