The reactions of trimethylaluminum (TMAl) and ammonia (NH3) on gamma-a
lumina were studied by Fourier transform infrared spectroscopy, therma
l desorption spectroscopy, and X-ray photoelectron spectroscopy (XPS)
to explore their feasibility as precursors for the low-temperature gro
wth of AlN. Upon exposure of TMAl and NH3, covalently bonded Al-N netw
orks are formed at room temperature. This reaction efficiency is enhan
ced by a factor of 4 when the NH3 is dosed with the substrate at 600 K
. An atomic layer growth process involving cyclic processing at 600 K
yielded site-specific reaction of the TMAl, followed by facile reactio
n of the ammonia to create new sites for the TMAl reaction. XPS result
s confirmed the presence of AlN.