Hs. Ubhi et Aw. Bowen, ANALYSIS AND REPRESENTATION OF ELECTRON BACKSCATTERED DIFFRACTION TEXTURE DATA - EXAMPLES FROM HEAT-TREATED AL-LI ALLOY SHEET, Materials science and technology, 12(10), 1996, pp. 880-886
A number of approaches for graphically representing electron backscatt
ered diffraction grain orientation measurements are presented, using a
s examples the distributions and variations of texture in two 8090 Al-
Li alloys. In this manner the component orientations constituting the
overall texture can be illustrated readily and their relative volume f
ractions calculated. The locations of texture components can be repres
ented by texture distribution plots. The power of Mackenzian plots is
illustrated by demonstrating their capacity to represent the degree of
scatter about all ideal orientation, show differences in distribution
that may be either real or due to specimen preparation, and highlight
when tno ideal orientations that are very close to each other, namely
, {110}[112] and {110}[335] in this work, may be presented. (C) Crown
copyright/DERA, published with the permission of Controller HMSO.