ANALYSIS AND REPRESENTATION OF ELECTRON BACKSCATTERED DIFFRACTION TEXTURE DATA - EXAMPLES FROM HEAT-TREATED AL-LI ALLOY SHEET

A number of approaches for graphically representing electron backscatt ered diffraction grain orientation measurements are presented, using a s examples the distributions and variations of texture in two 8090 Al- Li alloys. In this manner the component orientations constituting the overall texture can be illustrated readily and their relative volume f ractions calculated. The locations of texture components can be repres ented by texture distribution plots. The power of Mackenzian plots is illustrated by demonstrating their capacity to represent the degree of scatter about all ideal orientation, show differences in distribution that may be either real or due to specimen preparation, and highlight when tno ideal orientations that are very close to each other, namely , {110}[112] and {110}[335] in this work, may be presented. (C) Crown copyright/DERA, published with the permission of Controller HMSO.