IBM has developed an assembly process to attach a new family of Solder
Ball Connect (SBC) integrated circuit packages to glass/epoxy cards u
sing surface mount technology (SMT). The process provides nearly perfe
ct yields for the resulting solder ball joint structures and ensures r
eliability by controlling wear-out due to metallurgical fatigue. The p
ackage, card, and process parameters found to most strongly influence
the assembly yield and reliability are summarized, and unique test har
dware and analysis techniques are discussed. Process considerations, a
nalytical techniques, and test methods described for SBC packages shou
ld apply to other ball grid array (BGA) packages.