Av. Sachenko et Tv. Panichevskaya, ON THE EFFECT OF SURFACE-STATES ON PHOTOC URRENT KINETICS IN THE SURFACE-BARRIER MIS TUNNEL STRUCTURES, UKRAINSKII FIZICHESKII ZHURNAL, 38(8), 1993, pp. 1269-1274
Recharging of surface electron states has been theoretically studied f
or its effect on photocurrent kinetics in the surface-barrier MIS tunn
el structures under modulated illumination. The displacement current i
s shown to substantially change photocurrent relaxation kinetics when
conditions are close to the shorting. Then time of photocurrent transi
tion to a steady state is tau(w), the time of capacitance recharging f
or space-charge region in a semiconductor. The only exception is the c
ase when effective rate of surface recombination is equal to or greate
r than the effective rate of minority carriers now into contact. For t
hat case the photocurrent, after switching on illumination, firstly re
aches (in time tau(w)) the value of photogeneration current and then i
s relaxing to a stationary value, the time or the last process being d
etermined by surface states parameters.