PHOTOACOUSTOELECTRIC PROBING OF ELECTRIC INHOMOGENEITIES

Citation
Pv. Burliy et al., PHOTOACOUSTOELECTRIC PROBING OF ELECTRIC INHOMOGENEITIES, UKRAINSKII FIZICHESKII ZHURNAL, 38(9), 1993, pp. 1408-1410
Citations number
3
Categorie Soggetti
Physics
ISSN journal
02023628
Volume
38
Issue
9
Year of publication
1993
Pages
1408 - 1410
Database
ISI
SICI code
0202-3628(1993)38:9<1408:PPOEI>2.0.ZU;2-W
Abstract
Acoustoelectronic interaction in the layered structure (electrically i nhomogeneous layer -piezoelectric plate - photosensitive semiconductor ) has been studied. It has been shown that in layered structures of th is type electrical inhomogeneities of different nature, including thos e produced by the optical radiation, can be detected due to the contro l of acoustoelectronic interaction.