DETERMINATION OF WAVELENGTH DEPENDENCE OF THE REFLECTIVITY AT AR COATED DIODE FACETS

Authors
LUO B WU L CHEN J
Citation
B. Luo et al., DETERMINATION OF WAVELENGTH DEPENDENCE OF THE REFLECTIVITY AT AR COATED DIODE FACETS, IEEE photonics technology letters, 5(11), 1993, pp. 1279-1281
Citations number
10
Categorie Soggetti
Optics,"Physics, Applied
Journal title
IEEE photonics technology letters → ACNP
ISSN journal
10411135
Volume
5
Issue
11
Year of publication
1993
Pages
1279 - 1281
Database
ISI
SICI code
1041-1135(1993)5:11<1279:DOWDOT>2.0.ZU;2-7
Abstract
Wavelength dependence of the reflectivity at an AR coated diode facet has been determined by comparing the spontaneous emission spectra obta ined under the same bias condition before and after this facet is AR c oated. Reliable measurements can be achieved by proper choice of the b ias current.