Fj. Ahlers et al., BISTABILITY IN THE CURRENT-INDUCED BREAKDOWN OF THE QUANTUM HALL-EFFECT, Semiconductor science and technology, 8(12), 1993, pp. 2062-2068
The structure of the longitudinal resistance in the breakdown behaviou
r of the quantum Hall effect (QHE) of GaAs/AlGaAs heterostructures is
studied at a temperature of about 100 mK using samples with a constric
ted current path. Time-resolved measurements on a sample with a 50 mum
wide constriction show that the current-induced breakdown of the QHE
evolves as a switching between at least two states, a non-dissipative
one and a resistive one. The two states may coexist in some region of
magnetic field and sample current. This shows up in the time behaviour
of the longitudinal voltage, which is time-distributed in a statistic
al manner. Increasing the sample current at fixed magnetic field incre
ases the time the current carriers stay in the resistive state rho(dis
) until at high enough currents all backswitching into the non-dissipa
tive state is suppressed. At filling factors nu less-than-or-equal-to
2, the resistivity rho(dis), increases linearly with the difference DE
LTAnu = nu - nu(i) with nu(i) = 2. The corresponding voltages are foun
d to be less than homega(c)/eBAR at all sample currents, contrary to r
esults of Cage et al. For filling factors with nu greater-than-or-equa
l-to 2 the sample shows no similar effect. The results will be discuss
ed within the framework of several existing models for the breakdown b
ehaviour of the QHE.