We report on the structural characterization of CdTe/MnTe short-period
superlattices. The critical thickness of MnTe on CdTe layers was dete
rmined by reflection high-energy electron diffraction experiments. Det
ailed high-resolution x-ray diffraction measurements and the computer
simulation of the measured spectra enabled the determination of the zi
nc blende MnTe elastic properties in the superlattices. T.he knowledge
of these properties allowed the growth of strain balanced CdTe/MnTe s
uperlattices pseudomorphic to a Cd0.96Zn0-04Te buffer. The superlattic
es exhibited x-ray linewidths of about 100 arcsec.