EDDY-CURRENT MICROSCOPY USING A 77-K SUPERCONDUCTING SENSOR

Citation
Rc. Black et al., EDDY-CURRENT MICROSCOPY USING A 77-K SUPERCONDUCTING SENSOR, Applied physics letters, 64(1), 1994, pp. 100-102
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
1
Year of publication
1994
Pages
100 - 102
Database
ISI
SICI code
0003-6951(1994)64:1<100:EMUA7S>2.0.ZU;2-5
Abstract
We have used a scanning magnetic flux microscope based on a high trans ition temperature YBa2Cu3O7 superconducting quantum interference devic e (SQUID) to produce magnetic images of eddy currents in patterned Cu thin films and 11-30-mum-thick Cu on printed circuit boards. The field s produced by the eddy currents are imaged with a spatial resolution o f about 80 mum over a 100-mm2 sample area. With the sample and SQUID a t 77 K, the microscope uses typical probing fields of 80 nT and can ob tain simultaneously eddy current and static magnetic field images. At probing frequencies of 26-100 kHz, the system achieves a field sensiti vity of about 7 pT Hz-1/2.