CHARACTERIZATION OF THE SURFACES OF THE CONDUCTING SALTS ALPHA-(BEDT-TTF)(2)X (X=I3, IBR2) BY SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY

Citation
Sn. Magonov et al., CHARACTERIZATION OF THE SURFACES OF THE CONDUCTING SALTS ALPHA-(BEDT-TTF)(2)X (X=I3, IBR2) BY SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY, Synthetic metals, 62(1), 1994, pp. 83-89
Citations number
21
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Mining
Journal title
ISSN journal
03796779
Volume
62
Issue
1
Year of publication
1994
Pages
83 - 89
Database
ISI
SICI code
0379-6779(1994)62:1<83:COTSOT>2.0.ZU;2-K
Abstract
We carried out scanning tunneling microscopy (STM) and atomic force mi croscopy (AFM) measurements of the alpha-(BEDT-TTF)2X (X=I3 and IBr2) salts and interpreted the results on the basis of the partial density rho(r0, e(f)) and total electron density rho(r0) plots calculated by t he extended Huckel tight-binding method. Large scale STM images show s urface modifications induced by the tip-surface interactions. The STM and AFM images show the patterns of the cation layers. The rho(r0, e(f )) plots are essential in relating the features of the observed atomic -resolution STM images to the surface structures and show that the eth ylene-group hydrogen atoms of the protruded cations dominate the STM i mages. The dependence of the STM images of the BEDT-TTF salts on the t unneling gap resistance is probably caused by the tip-induced conforma tional change of the ethylene groups of the surface cations.