SIMULTANEOUS MEASUREMENTS OF SMALL-ANGLE X-RAY-SCATTERING, WIDE-ANGLEX-RAY-SCATTERING AND HEAT-EXCHANGE DURING CRYSTALLIZATION AND MELTINGOF POLYMERS

Citation
M. Bark et Hg. Zachmann, SIMULTANEOUS MEASUREMENTS OF SMALL-ANGLE X-RAY-SCATTERING, WIDE-ANGLEX-RAY-SCATTERING AND HEAT-EXCHANGE DURING CRYSTALLIZATION AND MELTINGOF POLYMERS, Acta polymerica, 44(6), 1993, pp. 259-265
Citations number
29
Categorie Soggetti
Polymer Sciences
Journal title
ISSN journal
03237648
Volume
44
Issue
6
Year of publication
1993
Pages
259 - 265
Database
ISI
SICI code
0323-7648(1993)44:6<259:SMOSXW>2.0.ZU;2-H
Abstract
Experimental equipment was constructed for simultaneous measurements o f wide angle X-ray scattering (WAXS), small angle X-ray scattering (SA XS) and differential scanning calorimetry (DSC) using synchrotron radi ation as a strong source of X-rays. The crystallization occurring duri ng heating of an initially amorphous sample with constant heating rate was investigated. Poly(ethylene naphthalene-2,6-dicarboxylate) (PEN), poly(ethylene terephthalate) (PET) and the copolymer PEN-co-PHB (90:1 0), where PHB stands for poly(p-hydroxybenzoic acid), were used as mat erials. By comparing the change of the degree of crystallinity as meas ured by WAXS and DSC with the change of the SAXS power Q, it was shown that the primary crystallization, during which morphological units li ke spherulites axe growing, is followed by a secondary crystallization during which the degree of crystallinity within the lamellar stacks i n the spherulites is increased. Assuming a two-phase system for the se micrystalline structure, consisting of crystals and amorphous regions, three different processes were shown to be responsible for this incre ase: The formation of new crystal lamellae within the already existing lamellar stacks, the thickening of already existing crystals at the e xpense of the amorphous regions, and the complete melting of crystals followed by formation of new, thicker, crystals.