Cy. Fong et al., BONDING PROPERTIES OF THE INTERACTING DONOR AND ACCEPTOR STATES OF SI-DOPED NIPI STRUCTURES IN GAAS, Modelling and simulation in materials science and engineering, 1(4), 1993, pp. 349-359
Two-layer idealized Si-doped NIPI structures in GaAs show (1) non-bond
ing character for the acceptor state and (2) significant antibonding f
eatures for the donor state. These properties cannot be anticipated fr
om the simple bonding picture deduced from the results of the delta-la
yer NIPI structures-the host crystal can be treated simply as a dielec
tric background. We attributed (1) to the consequence of minimizing th
e kinetic energy of the acceptor state to avoid localizing its charge
at the Ga atom which is the common nearest neighbor of the two accepto
r atoms. The physical origin for (2) is shown to be equivalent to the
Coulomb repulsion between the valence states of the host crystal and t
he donor state. The results of the two-layered NIPI case, especially f
or the donor state, illustrate explicitly that the occupied states of
the host crystal can play an important role in determining the bonding
properties of impurity states.