D. Sellier et G. Bossiere, SCANNING ELECTRON-MICROSCOPY IN ANALYSIS OF GLACIAL ABRASION OF QUARTZITIC SUBSTRATA, Zeitschrift fur Geomorphologie, 37(4), 1993, pp. 477-499
The paper presents the first results of a S.E.M. analysis of glacial a
brasion micromarks on quartzitic bedrock. The examined samples are fra
gments of polished flagstones directly collected on for-er glacial bed
s, from the Highlands of Scotland in an area where devensian glacial f
eatures are remarkably well preserved. Their S.E.M. examination allows
to define three main surface types from complicated initial microtopo
graphies. It also allows to distinguish typical microforms produced by
attrition or striation below temperate glaciers and to determine the
frequency of these microforms at different scales. Some comparisons ar
e made with abrasion features observed in the field with microforms kn
own on morainic quartz grains and with figures which occur on fault pl
anes.