X-RAY-DIFFRACTION CHARACTERIZATION OF WO3 SIO2, SURFACE-STRUCTURE/

Authors
BABICH IV ALEKSANKINA MM PLYUTO YV CHUIKO AA
Citation
Iv. Babich et al., X-RAY-DIFFRACTION CHARACTERIZATION OF WO3 SIO2, SURFACE-STRUCTURE/, Kinetics and catalysis, 34(3), 1993, pp. 493-495
Citations number
10
Categorie Soggetti
Chemistry Physical
Journal title
Kinetics and catalysis → ACNP
ISSN journal
00231584
Volume
34
Issue
3
Year of publication
1993
Pages
493 - 495
Database
ISI
SICI code
0023-1584(1993)34:3<493:XCOWSS>2.0.ZU;2-S
Abstract
The state of tungsten on the surface of dispersed silica during therma l treatment is studied by X-ray diffraction analysis and TGA. It is sh own that the supported tungsten-oxide phase structure can vary from a structure close to WO3.2H(2)O or WO3.H2O to one characteristic of crys talline WO3. A higher level of surface hydration for WO3/SiO2 samples as compared with SiO2 is associated with the surface H2O molecules ent ering the composition of the supported phase.