The properties of the near surface region in GaAs substrates doped wit
h Sn and Te are studied after annealing in H-2 flow or under controlle
d As overpressure. The transition regions between the bulk and the sur
face are formed upon such annealing. Also, the distribution of recombi
nation centres across these transition regions is governed by defects
diffused from the substrate and generated in the epitaxial layer.