DETERMINATION OF TELLURIUM IN SELENIUM BY WAVELENGTH DISPERSIVE-X-RAYFLUORESCENCE SPECTROMETRY

Authors
RAVINDRA HR RADHAKRISHNA G GOPALAN B SYAMSUNDAR S
Citation
Hr. Ravindra et al., DETERMINATION OF TELLURIUM IN SELENIUM BY WAVELENGTH DISPERSIVE-X-RAYFLUORESCENCE SPECTROMETRY, Analyst, 118(12), 1993, pp. 1559-1561
Citations number
17
Categorie Soggetti
Chemistry Analytical
Journal title
Analyst → ACNP
ISSN journal
00032654
Volume
118
Issue
12
Year of publication
1993
Pages
1559 - 1561
Database
ISI
SICI code
0003-2654(1993)118:12<1559:DOTISB>2.0.ZU;2-#
Abstract
An X-ray fluorescence spectrometric procedure has been developed for t he determination of tellurium in selenium. The method involves dissolu tion of the sample in HCl-HN0(3) and measurement of the Te Lat line in tensity using a scandium X-ray tube and a flow-proportional counter. I n the above determination, the Rayleigh-scattered Sc K alpha target li ne is used as an internal-ratio line. The procedure permits the determ ination of tellurium in the range 0.5-5% with 2.5% relative standard d eviation.