SURFACE CHARACTERIZATION BY LEED, RHEED, REM, STM, AND HOLOGRAPHY - PROCEEDINGS OF THE UNITED-STATES-JAPAN SEMINAR ON SURFACE CHARACTERIZATION BY ELECTRON-DIFFRACTION, REFLECTION ELECTRON-MICROSCOPY, AND HOLOGRAPHY - KONA, HAWAII, 16-19 MARCH 1993 - PREFACE

Authors
COHEN PI ICHIMIYA A
Citation
Pi. Cohen et A. Ichimiya, SURFACE CHARACTERIZATION BY LEED, RHEED, REM, STM, AND HOLOGRAPHY - PROCEEDINGS OF THE UNITED-STATES-JAPAN SEMINAR ON SURFACE CHARACTERIZATION BY ELECTRON-DIFFRACTION, REFLECTION ELECTRON-MICROSCOPY, AND HOLOGRAPHY - KONA, HAWAII, 16-19 MARCH 1993 - PREFACE, Surface science, 298(2-3), 1993, pp. 180000003-180000003
Citations number
NO
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
298
Issue
2-3
Year of publication
1993
Pages
180000003 - 180000003
Database
ISI
SICI code
0039-6028(1993)298:2-3<180000003:SCBLRR>2.0.ZU;2-W