A model relating the interparticulate contact stress within a tablet m
atrix with the compaction stress was developed previously to permit th
e nonlinear deformation kinetic analysis of the viscoelastic behavior
of pharmaceutical tablets with the known properties of the tablet cons
tituents. The present research was undertaken to determine whether the
inverse operation (i.e., using tablet stress relaxation to determine
single crystal properties) was possible. The stress relaxation of pota
ssium bromide (KBr) compacts was evaluated as a function of temperatur
e and relative density, and an attempt was made to calculate the defor
mation kinetic parameters. The stress relaxation of KBr did not fit th
e model under ambient conditions for two reasons: ( I) KBr has two sli
p systems with approximately the same shear stress at room temperature
; and (2) KBr strain-hardens. When these complications were taken into
consideration, the stress relaxation behavior could be explained. The
refore, whereas single crystal tests are capable of yielding parameter
s that can be used to predict compact behavior, the inverse process of
quantifying fundamental material parameters from compact behavior is
problematic due to the difficulty of determining, a priori, all the pr
ocesses that operate simultaneously.