Radiation damage in lithium orthosilicate (Li4SiO4) and Al-doped Li4Si
O4 (Li3.7Al0.1SiO4) irradiated with oxygen ions was studied with ionic
conductivity measurements, Raman spectroscopy, Fourier transform infr
ared photo-acoustic spectroscopy (FT-IR PAS) and transmission electron
microscopy. It was seen from the ionic conductivity measurements that
lithium-ion vacancies were introduced as irradiation defects for Li-i
ons sites in both materials due to the irradiation. By the Raman spect
roscopy, oxygen atoms in SiO4 tetrahedra were considered to be prefere
ntially displaced due to the irradiation for Li4SiO4, although only a
decrease of the number of SiO4 tetrahedra occurred for Li3.7Al0.1SiO4
by displacement of both silicon and oxygen atoms. Decomposition of SiO
4 tetrahedra and formation of some new phases having Si-O-Si and Si-O
bonds were found to take place for both Li4SiO4 and Li3.7Al0.1SiO4 by
FT-IR PAS. In the electron microscopy, damage microstructure consistin
g of many voids or cavities and amorphization were observed for Li4SiO
4 irradiated with oxygen ions. The recovery behavior of radiation dama
ge mentioned above was also investigated.