GROWTH AND CRYSTALLOGRAPHIC, SURFACE AND DEFECT STRUCTURES OF ANTIMONY PARTICLES DEPOSITED IN A HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE

Citation
T. Isshiki et al., GROWTH AND CRYSTALLOGRAPHIC, SURFACE AND DEFECT STRUCTURES OF ANTIMONY PARTICLES DEPOSITED IN A HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE, Thin solid films, 237(1-2), 1994, pp. 155-159
Citations number
20
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
237
Issue
1-2
Year of publication
1994
Pages
155 - 159
Database
ISI
SICI code
0040-6090(1994)237:1-2<155:GACSAD>2.0.ZU;2-Q
Abstract
Sb fine particles vacuum-deposited by in situ electron beam heating in an electron microscope were investigated by high-resolution transmiss ion electron microscopy. Round amorphous particles less than 40 nm in size were formed far from the evaporation source, and crystalline part icles having definite crystal habits near the source. Observed wedge-s haped crystallites have smooth (110), (111) and/or (112) surfaces, whe re lattice relaxation and superlattice structure cannot be seen. Stack ing faults represented by ab ca/ca bc/bc ab, which are caused by slipp ings by a glide vector of 1/3[($) over bar 112]a(0), are found in part icles having the normal sequence ab ca be ab ca be ab ca be, where a, b and c denote atomic layers in the rhombohedral structure.