ROLE OF POLY-3-METHYLTHIOPHENE STRUCTURE DETERMINED BY AFM ON THE DIELECTRIC-CONSTANT SPECTRA

The structure of PMeT films were studied by AFM at different stages of the electrodeposition process: nucleation, first layer and successive thicker layers were imaged. Dielectric constant spectra were determin ed by spectroscopic ellipsometry for the corresponding depositions. Th e analysis of results identifies differences between intrinsic propert ies, (such as the energy of optical transitions), which do not depend on structure and effective properties, (such as the absolute values of dielectric constants), which depend greatly on it.