MAGNETOSTRICTION MEASUREMENT BY INTERFEROMETRY

Authors
BELLESIS GH HARLLEE PS RENEMA A LAMBETH DN
Citation
Gh. Bellesis et al., MAGNETOSTRICTION MEASUREMENT BY INTERFEROMETRY, IEEE transactions on magnetics, 29(6), 1993, pp. 2989-2991
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
29
Issue
6
Year of publication
1993
Part
1
Pages
2989 - 2991
Database
ISI
SICI code
0018-9464(1993)29:6<2989:MMBI>2.0.ZU;2-J
Abstract
A laser Doppler interferometric method using synchronous detection to measure the magnetostriction of soft magnetic films is described. The instrument has measured 2 angstrom magnetostrictive deflections of per malloy films on 500 mum silicon substrates. Saturation magnetostrictio n of 10(-9) can be measured for 1000 nm films on 100 mum Si substrates . The ultimate resolution of the interferometer is 0.1 angstrom as dem onstrated using piezo-electrically-driven mirrors.