AN APPROACH FOR NANOLITHOGRAPHY USING ELECTRON HOLOGRAPHY

Citation
K. Ogai et al., AN APPROACH FOR NANOLITHOGRAPHY USING ELECTRON HOLOGRAPHY, JPN J A P 1, 32(12B), 1993, pp. 5988-5992
Citations number
4
Categorie Soggetti
Physics, Applied
Volume
32
Issue
12B
Year of publication
1993
Pages
5988 - 5992
Database
ISI
Abstract
A technique of electron holography was applied to nanofabrication. Ele ctron interference fringes whose spacing was 108 nm were successfully recorded on polymethylmethacrylate (PMMA) resist using a W[100] therma l field emission (TFE) gun and an electron biprism both set on a conve ntional transmission electron microscope (TEM). Furthermore, we have a ttempted the fabrication of a free-standing multi-biprism by electron beam lithography and dry etching, leading to a new fabrication method of a nanoscale grating with a short exposure.