AN APPROACH FOR NANOLITHOGRAPHY USING ELECTRON HOLOGRAPHY
Citation
K. Ogai et al., AN APPROACH FOR NANOLITHOGRAPHY USING ELECTRON HOLOGRAPHY, JPN J A P 1, 32(12B), 1993, pp. 5988-5992
Categorie Soggetti
Physics, Applied
Abstract
A technique of electron holography was applied to nanofabrication. Ele
ctron interference fringes whose spacing was 108 nm were successfully
recorded on polymethylmethacrylate (PMMA) resist using a W[100] therma
l field emission (TFE) gun and an electron biprism both set on a conve
ntional transmission electron microscope (TEM). Furthermore, we have a
ttempted the fabrication of a free-standing multi-biprism by electron
beam lithography and dry etching, leading to a new fabrication method
of a nanoscale grating with a short exposure.