DEFECT DISTRIBUTION IN ELECTRON-IRRADIATED CDS MATERIALS

Authors
ACHOUR S BENLAHRACHE MT HARABI A
Citation
S. Achour et al., DEFECT DISTRIBUTION IN ELECTRON-IRRADIATED CDS MATERIALS, Thin solid films, 238(1), 1994, pp. 110-114
Citations number
4
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
238
Issue
1
Year of publication
1994
Pages
110 - 114
Database
ISI
SICI code
0040-6090(1994)238:1<110:DDIECM>2.0.ZU;2-5
Abstract
Native defects and impurity diffusion in various CdS materials were st udied by combined techniques involving cathodoluminescence (CL) and el ectron probe microanalysis (EPMA). CL spectra, colour CL micrographs a nd EPMA modes were applied to map the defect diffusion and distributio n after low energy electron bombardment (LEEB). Different contrast mod ifications were induced by LEEB. Particle ejection and defect diffusio n have been accounted for in explaining the observed phenomena.