La. Wenzler et al., AN INTEGRATED SCANNING TUNNELING, ATOMIC-FORCE AND LATERAL FORCE MICROSCOPE, Review of scientific instruments, 65(1), 1994, pp. 85-88
We describe the design and operation of a combined scanning tunneling-
atomic force-lateral force microscope [(STM), (AFM), (LFM)]. Including
these capabilities in a single instrument reduces construction costs
and increases flexibility. AFM and LFM may be performed simultaneously
; a simple reconfiguration (requiring removing the AFM/LFM cantilever
holder and replacing with a STM tip) changes the instrument into a STM
. We present atomic forces depicted in force-to-distance curves and ex
perimental imaging applications with all three techniques.