AN INTEGRATED SCANNING TUNNELING, ATOMIC-FORCE AND LATERAL FORCE MICROSCOPE

We describe the design and operation of a combined scanning tunneling- atomic force-lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously ; a simple reconfiguration (requiring removing the AFM/LFM cantilever holder and replacing with a STM tip) changes the instrument into a STM . We present atomic forces depicted in force-to-distance curves and ex perimental imaging applications with all three techniques.