K. Bock et Hl. Hartnagel, FIELDEMITTER-BASED ESD-PROTECTION CIRCUITS FOR HIGH-FREQUENCY DEVICESAND ICS, Journal of electrostatics, 31(2-3), 1993, pp. 263-279
Based on investigations to find the thresholds of the ESD voltage indu
cing degradations to GaAs Schottky diodes and MESFETS, we have develop
ed and fabricated new ESD protection structures based on electron fiel
d emission. Using these GaAs electron field-emitter wedges we have des
igned and fabricated protection circuits integrated in GaAs microwave
devices to prevent the devices from degradation caused by ESD.