Electron-stimulated desorption (ESD) kinetic energy distributions (KED
s) of H+ and H- have been obtained from trimethylsilane-dosed Si(100)
as a function of trimethylsilane exposure. Both H+ and H- KEDs exhibit
bimodal KEDs, suggesting that hydrogen is bound in two distinct state
s for trimethylsilane-covered Si(100). ESD KED and secondary ion mass
spectrometry (SIMS) data suggest that most species present on the fres
hly dosed surface are still present in residual amounts after gentle a
nneals to 173 K, indicating that molecularly adsorbed trimethylsilane
is only weakly bound to the surface and that some trimethylsilane diss
ociates on the Si(100) surface. Additionally, the low-energy H- KED pe
ak intensity behaves like the high-energy H+ KED peak intensity as a f
unction of trimethylsilane exposure, and vice versa.